Multi-level sequential circuit partitioning for test vector generation for low power test in VLSI
نویسندگان
چکیده
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ژورنال
عنوان ژورنال: International Journal of Engineering, Science and Technology
سال: 2011
ISSN: 2141-2839,2141-2820
DOI: 10.4314/ijest.v2i11.64556